Non-destructive testing apparatus and non-destructive...

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test

Reexamination Certificate

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C374S004000, C374S043000

Reexamination Certificate

active

07484883

ABSTRACT:
To detect a defect without being limited to the current path of a sample. The presence or absence of a defect in a sample is detected by allowing said sample to stand for a predetermined period of time after heating said sample with a heat source and by observing the temperature distribution formed on said sample by an observation unit.

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patent: 6405359 (2002-06-01), Tseng et al.
patent: 6517236 (2003-02-01), Sun et al.
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patent: 7009695 (2006-03-01), Some
patent: 2004/0028113 (2004-02-01), Schlagheck et al.
patent: 2004/0183019 (2004-09-01), Mandelis et al.
patent: 2000-46772 (2000-02-01), None
“History of Development of Obirch method, Present and Future Perspective” Journal of Reaj, vol. 25, No. 8, pp. 853 to 856 (2003).

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