4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Kiyoshi Nikawa

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Apparatus for diagnosing interconnections of semiconductor integ

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Device and method for nondestructive inspection on...

Batteries: thermoelectric and photoelectric – Thermoelectric – Electric power generator
Reexamination Certificate

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Device and method for nondestructive inspection on...

Batteries: thermoelectric and photoelectric – Thermoelectric – Thermopile
Reexamination Certificate

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Device and method for nondestructive inspection on...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Dynamic fault imaging system using electron beam and method of a

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Profile ID: LFUS-PAI-P-399497

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