Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1988-06-07
1990-07-03
Evans, F. L.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
250560, 364560, 36457104, 378 54, G01B 1108
Patent
active
049385992
ABSTRACT:
Non-contact gauges and methods of optical measurement are provided which include storing a signature indicative of an error associated with measuring a known dimension and then determining an unknown dimension in relation to this signature. The novel technique enables low cost production of preferred gauge designs using standard, off the shelf components. The non-contact gauge includes a radiation source directed toward the object to be measured and a scanning device, preferably a rotating drum having small slits disposed therethrough, for producing a signal responsive to an image produced by the radiation source upon the object. The device is capable of having a resolution of about 0.0001 inches and an accuracy of about +/0.00025 inches. The device can include a nuclear radiation source, such as X-ray radiation, for determining wall-thicknesses. The designs disclosed further produce cross-sectional images of solid and hollow objects.
REFERENCES:
patent: 3874798 (1975-04-01), Antonsson et al.
patent: 3905705 (1975-09-01), Petrohilos
patent: 3955072 (1976-05-01), Johannsmeier et al.
patent: 4037968 (1977-07-01), King et al.
patent: 4082463 (1978-04-01), Dehait et al.
patent: 4097158 (1978-06-01), Dehait
patent: 4101612 (1978-07-01), Barker et al.
patent: 4152767 (1979-05-01), Laliotis
patent: 4168126 (1979-09-01), Altman et al.
patent: 4269514 (1981-05-01), Vossberg
"Operating & Service Manual for the Milmaster Electronic Micrometer Model SWGH-10R", Electron-Machine Corp., Umatilla, Fla. (1980).
"SPEC Machine Vision & Control Systems", Target Systems, Inc., Salt Lake City, Utah (undated).
Simonson et al., "Advances in Instrumentation: Optical Detection of Surface Flaws", I.S.A., vol. 38-part 2. (1983).
Taylor, "Using a Laser Micrometer for Precision Control of Wire Diameter and Position of CV Line", pp. 326-329 (undated).
Single Plane; BETA Better by Design, The Compact Series: BETA-COMPAGAGE.COPYRGT.; Bulletin 7.0-Feb. 88, printed in England (2 page advertisement).
Contrologic, Inc.
Evans F. L.
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