Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1995-01-06
1996-10-22
Rosenberger, Richard A.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
356394, G01B 1104
Patent
active
055682634
ABSTRACT:
An improved non-contact inspection system capable of evaluating spatial form parameters of a workpiece to provide 100% inspection of parts in production. The system causes parts to be sequentially loaded onto an incline track where they pass through a test section. The test section includes a length detection array for measuring the length of the workpiece, which includes a source generating a sheet of light oriented in the longitudinal direction of the workpiece. The profile of the parts are evaluated by one or more light sources also creating a sheet of light oriented transverse to the longitudinal axis of the parts. First and second pairs of single channel photodetectors are provided for each of the light sources which provides a pair of analog outputs of the extent to which each sheet of light is occluded by the part, as well as an ability to eliminate noise or scintillation caused by a point source of light, for example with a laser light source. These outputs are analyzed through appropriate signal processing hardware and software to generate length and profile data related to the workpiece geometry.
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Mectron Engineering Company
Rosenberger Richard A.
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