Multilevel poly-Si tiling for semiconductor circuit manufacture

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S183000, C438S195000, C438S241000, C438S243000, C438S244000, C438S245000, C438S246000, C438S247000, C438S252000, C438S253000, C438S258000, C438S622000, C438S623000, C438S773000, C438S774000, C257SE21243, C257SE21244, C257SE21688, C257SE21689

Reexamination Certificate

active

07148103

ABSTRACT:
Method of manufacturing a semiconductor device, including a first baseline technology electronic circuit (1) and a second option technology electronic circuit (2) as functional parts of a system-on-chip, by:manufacturing the first electronic circuit (1) with a first conductive layer (6; 6) that is patterned by subjecting an exposed layer portion thereof to Reactive Ion Etching (RIE);manufacturing the second electronic circuit (2) with a second conductive layer (6; 8) that is patterned by subjecting an exposed layer portion thereof to RIE;providing a tile structure (25; 26);providing the tile structure (25; 26) with at least one dummy conductive layer (6; 8) produced in the same processing step as the second conductive layer (6; 8); andexposing the dummy conductive layer (6; 8), at least partially, to obtain an exposed dummy layer portion, and RIE-etching of that exposed portion too when the second (6; 8) conductive layer is subjected to RIE.

REFERENCES:
patent: 5361234 (1994-11-01), Iwasa
patent: 5441915 (1995-08-01), Lee
patent: 5607868 (1997-03-01), Chida et al.
patent: 6030876 (2000-02-01), Koike
patent: 6458655 (2002-10-01), Yuzuriha et al.
Wolf et al. Silicon Processing for the VLSI Era, vol. 1—Process Technology, Second Edition, Lattice Press 2000, pp. 666-667.

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