Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-03-28
2006-03-28
Picardat, Kevin M. (Department: 2822)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S637000, C438S638000, C438S639000, C438S668000
Reexamination Certificate
active
07018917
ABSTRACT:
Multiple metallization layers in a partially fabricated integrated circuit are formed in a single process step. As a place-holder for the later-deposited metallization layers, sacrificial material is deposited in the integrated circuit at desired locations at various fabrication levels over a substrate. The sacrificial material is then removed to form a contiguous open volume spanning multiple fabrication levels. A conductor is then deposited in the open volume to form multiple metallization layers in a single step.
REFERENCES:
patent: 4450472 (1984-05-01), Tuckerman et al.
patent: 4938742 (1990-07-01), Smits
patent: 5218515 (1993-06-01), Bernhardt
patent: 5241450 (1993-08-01), Bernhardt et al.
patent: 5461003 (1995-10-01), Havemann et al.
patent: 5619177 (1997-04-01), Johnson et al.
patent: 5777292 (1998-07-01), Grigorov et al.
patent: 5901037 (1999-05-01), Hamilton et al.
patent: 5936295 (1999-08-01), Havemann et al.
patent: 6060383 (2000-05-01), Nogami et al.
patent: 6239025 (2001-05-01), Bease et al.
patent: 6272169 (2001-08-01), Boswell, Jr. et al.
patent: 6291353 (2001-09-01), Muller et al.
patent: 6365529 (2002-04-01), Hussein et al.
patent: 6406995 (2002-06-01), Hussein et al.
patent: 6482733 (2002-11-01), Raaijmakers et al.
patent: 6534395 (2003-03-01), Werkhoven et al.
patent: 6569754 (2003-05-01), Wong et al.
patent: 6629425 (2003-10-01), Vaiyapuri et al.
patent: 6686271 (2004-02-01), Raaijmakers et al.
patent: 6699783 (2004-03-01), Raaijmakers et al.
patent: 6703708 (2004-03-01), Werkhoven et al.
patent: 6716693 (2004-04-01), Chan et al.
patent: 6727169 (2004-04-01), Raaijmakers et al.
patent: 2003/0032281 (2003-02-01), Werkhoven et al.
patent: 2003/0143839 (2003-07-01), Raaijmakers et al.
patent: WO 98/03996 (1998-01-01), None
patent: WO 98/03997 (1998-01-01), None
patent: WO 98/04109 (1998-01-01), None
patent: WO 03/053895 (2003-07-01), None
Blackburn, J.M. et al., “Deposition of conformal copper and nickel films from supercritical carbon dioxide,” Science 294(5540) (2001) pp. 141-145.
Cabanas, A. et al., “Alcohol-Assisted Deposition of Copper Films from Supercritical Carbon Dioxide,” J. Chemistry of Materials 15(15) (2003) pp. 2910-2916.
Dagani, Ron, “Dry Spinning f Carbon Nanotube Yarns”.
Kondoh, E. et al., “Characteristics of copper deposition in a supercritical CO2 fluid,” Microelectronic Engineering 64(1-4) (2002) pp. 495-499.
Lesiak, B. et al., “Characterization of Polyacetylene and Polyacetylene Doped with Palladium,” Polish J. Chem., 74:847-865 (2000).
J.-Q. Lü et al., Advanced Metallization Conference 2000 (ULSI XVI), pp. 515-521.
Shirakawa, Hideki et al., “Synthesis of Electrically Conducting Organic Polymers: Halogen Derivatives of Polyacetylene, (CH)x,” J.C.S., Chem. Comm., 578-580 (1977).
Tay, Andrew A.O., “Analytical Study on A MEMS Micro-Cooling System for Cooling of Flip Chips,” Conf. on Design, Characterization, and Packaging for MEMS and Microelectronics, Queensland, Australia, Oct. 99, SPIE vol. 3893, pp. 82-93.
ASM International N.V.
Knobbe Martens Olson & Bear LLP
Picardat Kevin M.
LandOfFree
Multilayer metallization does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Multilayer metallization, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multilayer metallization will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3596929