Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Physical deformation
Reexamination Certificate
2011-01-11
2011-01-11
Richards, N Drew (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Physical deformation
C257S314000, C438S052000, C365S164000
Reexamination Certificate
active
07868401
ABSTRACT:
Provided are a multibit electro-mechanical memory device and a method of manufacturing the same. The device may include at least one bit line in a first direction on a substrate; at least one gate line and at least one lower word line in parallel by a given interval and in a second direction intersecting the first direction on the at least one bit line; at least one contact pad adjacent to the at least one gate line on the at least one bit line; and at least one cantilever electrode coupled to the at least one contact pad, configured to float with a void above and beneath the at least one cantilever electrode and configured to curve in a third direction vertical to the first and second directions.
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Cho Keun-Hwi
Kim Min-Sang
Kim Sung-Min
Lee Ji-Myoung
Harness & Dickey & Pierce P.L.C.
Jung Michael
Richards N Drew
Samsung Electronics Co,. Ltd.
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