Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-05-24
2011-05-24
Dickey, Thomas L (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE21652, C438S259000
Reexamination Certificate
active
07948024
ABSTRACT:
A nonvolatile memory device is provided that includes; a first semiconductor layer extending in a first direction, a second semiconductor layer extending in parallel with and separated from the first semiconductor layer, an isolation layer between the first semiconductor layer and second semiconductor layer, a first control gate electrode between the first semiconductor layer and the isolation layer, a second control gate electrode between the second semiconductor layer and the isolation layer, wherein the second control gate electrode and first control gate electrode are respectively disposed at opposite sides of the isolation layer, a first charge storing layer between the first control gate electrode and the first semiconductor layer, and a second charge storing layer between the second control gate electrode and the second semiconductor layer.
REFERENCES:
patent: 6486027 (2002-11-01), Noble et al.
patent: 6677204 (2004-01-01), Cleeves et al.
patent: 2008/0242034 (2008-10-01), Mokhlesi et al.
patent: 2008172164 (2008-07-01), None
patent: 1020060089547 (2006-08-01), None
Kim Suk-pil
Koo June-mo
Park Yoon-dong
Yoon Tae-eung
Dickey Thomas L
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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