Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-12-14
2010-02-16
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S727000
Reexamination Certificate
active
07665002
ABSTRACT:
A single test access port, such as a JTAG-based debug port may be utilized to perform debug operations on logic cores of a multi-core integrated circuit, such as a multi-core processor. The shared debug port may respond to a particular command to enter a debugging mode and may be configured to forward all commands and data to a debugging controller of the integrated circuit during debugging. A mask register may be used to indicate which logic cores of the multi-core integrated circuit should be debugged. Additionally, custom debugging commands may include mask or core select fields to indicate which logic cores should be affected by the particular command. Debugging mode may be initialized for one or more logic cores either externally, such as be asserted a DBREQ signal, or internally, such as by configuring one or more breakpoints.
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