Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-07-18
2010-06-08
Fahmy, Wael (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S316000, C257S317000, C257S320000, C257S318000, C257S366000, C257S387000, C257SE29134, C257SE29138
Reexamination Certificate
active
07732853
ABSTRACT:
Nonvolatile integrated circuit memory devices having a 2-bit memory cell include a substrate, a source region and a drain region in the substrate, a step recess channel between the source region and the drain region, a trapping structure including a plurality of charge trapping nano-crystals on the step recess channel, and a gate on the trapping structure. Related fabrication methods are also described.
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Armand Marc
Fahmy Wael
Myers Bigel Sibley & Sajovec P.A.
Samsung Electronics Co,. Ltd.
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