Static information storage and retrieval – Systems using particular element – Magnetoresistive
Reexamination Certificate
2007-01-30
2007-01-30
Nguyen, VanThu (Department: 2824)
Static information storage and retrieval
Systems using particular element
Magnetoresistive
C365S171000, C365S173000
Reexamination Certificate
active
11030453
ABSTRACT:
A magnetic random access memory (MRAM) cell that includes an MRAM stack and a conductive line for carrying write current associated with the MRAM cell. The conductive line is oriented in a direction that is angularly offset from an easy axis of the MRAM stack by an acute angle, such as about 45 degrees.
REFERENCES:
patent: 6005800 (1999-12-01), Koch et al.
patent: 6114719 (2000-09-01), Dill et al.
patent: 6335890 (2002-01-01), Reohr et al.
patent: 6490217 (2002-12-01), DeBrosse et al.
patent: 6509621 (2003-01-01), Nakao
patent: 6515897 (2003-02-01), Monsma et al.
patent: 6522579 (2003-02-01), Hoenigschmid
patent: 6567299 (2003-05-01), Kunikiyo et al.
patent: 6590803 (2003-07-01), Saito et al.
patent: 6594191 (2003-07-01), Lammers et al.
patent: 6621731 (2003-09-01), Bessho et al.
patent: 6661689 (2003-12-01), Asao et al.
patent: 6693822 (2004-02-01), Ito
patent: 6693826 (2004-02-01), Black, Jr. et al.
patent: 6711053 (2004-03-01), Tang
patent: 6809958 (2004-10-01), Bloomquist et al.
patent: 6909631 (2005-06-01), Durlam et al.
patent: 6917087 (2005-07-01), Chen
patent: 6992918 (2006-01-01), Li et al.
patent: 7016222 (2006-03-01), Morikawa
patent: 7057253 (2006-06-01), Braun
patent: 2002/0105827 (2002-08-01), Redon et al.
patent: 2003/0048676 (2003-03-01), Daughton et al.
patent: 2003/0086313 (2003-05-01), Asao
F. Montaigne, et al., “Enhanced Tunnel Magnetoresistance At High Bias Voltage In Double-Barrier Planar Junctions”, Applied Physics Letters, vol. 73, No. 19, Nov. 9, 1998, pp. 2829-2831.
Yoshiaki Saito et al., “Correlation Between Barrier Width, Barrier Height, and DC Bias Voltage Dependences on the Magnetoresistance Ratio in Ir-Mn Exchange Biased Single and Double Tunnel Junctions”, The Japan Society of Applied Physics, Jpn. J. Appl. Phys. vol. 39 (2000) pp. L1035-L1038, Part 2, No. 10B, Oct. 15, 2000.
Lai Li-Shyue
Lin Wen Chin
Tang Denny D.
Nguyen Van-Thu
Taiwan Semiconductor Manufacturing Company , Ltd.
LandOfFree
MRAM cell with reduced write current does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with MRAM cell with reduced write current, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and MRAM cell with reduced write current will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3733246