Electrical transmission or interconnection systems – Personnel safety or limit control features – Interlock
Patent
1989-08-10
1992-03-10
Callahan, Timothy P.
Electrical transmission or interconnection systems
Personnel safety or limit control features
Interlock
307231, 307571, 374185, H01L 3100, H03K 326
Patent
active
050952277
ABSTRACT:
A semiconductor temperature detecting circuit is provided having a plurality of pairs of a MOS transistor for supplying current and a polycrystalline silicon resistor connected in series thereto. Each such pair is connected in between a first and a second power supply line. The voltage across the terminals of each polycrystalline silicon resistor is converted to a digital logic value and the combination of all such digital outputs represents the detected temperature. Each current supply transistor has its gate electrode connected to a common circuit which sets the current supply. The current setting circuit includes two p-channel MOS transistors and two n-channel MOS transistors. Each p-channel transistor in the current setting circuit has a current electrode connected to one power supply line and another current electrode connected to a current electrode of a corresponding n-channel transistor. Each n-channel transistor has its other current electrode connected to the other power supply line. One of the p-channel transistors has its gate electrode connected to a common point between one of its current electrode and a corresponding n-channel transistor, and the circuit output is taken from that gate electrode. The other p-channel transistor has its gate electrode connected to the power supply line connected to the n-channel transistors, and its current electrode connecting to a corresponding n-channel transistor is also commonly connected to the gate electrode of the two n-channel transistors.
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Jaeger et al., "Integrated MOS Temperature Sensor", IEE Conference: Nashville, Tenn., Apr. 1980, pp. 161-162.
Callahan Timothy P.
Samsung Electronics Co,. Ltd.
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