Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1997-01-14
1999-07-13
Booth, Richard A.
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
438478, H01L 21336, H01L 2120
Patent
active
059239859
ABSTRACT:
A method of manufacturing a MOS field effect transistor comprises forming on a semiconductor substrate a first epitaxial growth layer having an impurity doping concentration lower than that of the semiconductor substrate, forming on the first epitaxial growth layer a second epitaxial growth layer having an impurity concentration higher than that of the first epitaxial growth layer and having a thickness equal to or less than a diffusion depth of a source and a drain region, and forming on the second eptiaxial growth layer a third epitaxial growth layer having an impurity concentration lower than that of the second epitaxial growth layer and having a thickness equal to or less than that of a depletion layer at a channel region.
REFERENCES:
patent: 3996657 (1976-12-01), Simko et al.
patent: 4063271 (1977-12-01), Bean et al.
patent: 4242691 (1980-12-01), Kotani et al.
patent: 4317690 (1982-03-01), Koomen et al.
patent: 4420870 (1983-12-01), Kimura
patent: 4525378 (1985-06-01), Schwabe et al.
patent: 4535530 (1985-08-01), Denda et al.
IBM Technical Disclosure Bulletin, vol. 20, No. 10, Mar. 1978, "FET Structures for Very High Performance Circuits Operating at Low Temperatures", E.F. Miersch et al.
Aoki Kenji
Takada Ryoji
Booth Richard A.
Seiko Instruments Inc.
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