Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating
Reexamination Certificate
2011-07-05
2011-07-05
Lee, Hsien-ming (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
With means to control surface effects
Insulating coating
C257SE21242, C438S787000, C438S781000, C438S790000
Reexamination Certificate
active
07973390
ABSTRACT:
A modifier for lowering relative dielectric constant of a low dielectric constant film used in semiconductor devices, the modifier of the low dielectric constant film being characterized in that it contains as an effective component a silicon compound represented by formula (1)in-line-formulae description="In-line Formulae" end="lead"?R3-nHnSiN3 (1)in-line-formulae description="In-line Formulae" end="tail"?in which R is a C1-C4 alkyl group, and n is an integer from 0 to 3.
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Ogawa Tsuyoshi
Ohashi Mitsuya
Central Glass Company Limited
Crowell & Moring LLP
Lee Hsien-Ming
Swanson Walter H
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