Mode entrance control circuit and mode entering method in...

Details Mode entrance control circuit and mode entering method in... Mode entrance control circuit and mode entering method in...

2005-03-22

2005-03-22

Phung, Anh (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S189070, C365S189090

Reexamination Certificate

active

06870783

ABSTRACT:
In a mode entrance control circuit and a mode entering method to stably enter a semiconductor memory device into a predetermined operating mode only when insensitive to a change of a process, temperature, or voltage, etc., and simultaneously satisfying a constant entrance condition, the mode entrance control circuit includes an operation control part for generating an operation enable signal when a first voltage applied through a first pad is over a first determination voltage, a voltage division part for dividing a second voltage applied through a second pad to generate a trimming reference voltage, and a mode entrance signal generating part operated in response to the operation enable signal, for comparing a level of an applied fixed reference voltage with a level of the trimming reference voltage, and for generating a mode entrance enable signal to allow the semiconductor memory device to enter into a predetermined mode.

REFERENCES:
patent: 5367491 (1994-11-01), Han et al.
patent: 5373472 (1994-12-01), Ohsawa
patent: 5896324 (1999-04-01), Jang et al.
patent: 6121806 (2000-09-01), Kono et al.
patent: 6522589 (2003-02-01), Miyakawa et al.
patent: 20020069026 (2002-06-01), Endo
patent: 20030026139 (2003-02-01), Endo et al.
patent: 20030135801 (2003-07-01), Chevallier

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