Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Physical deformation
Reexamination Certificate
2011-03-01
2011-03-01
Le, Thao P. (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Physical deformation
C257S433000
Reexamination Certificate
active
07898046
ABSTRACT:
An encapsulated MEMS process including a high-temperature anti-stiction coating that is stable under processing steps at temperatures over 450 C is described. The coating is applied after device release but before sealing vents in the encapsulation layer. Alternatively, an anti-stiction coating may be applied to released devices directly before encapsulation.
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Fuchs Tino
Kronmueller Silvia
Laermer Franz
Metz Matthias
Stark Brian
Dergosits & Noah LLP
Le Thao P.
Robert & Bosch GmbH
Staniford Geoffrey T.
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