Methods of generating plasma, of etching an organic material...

Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S714000, C204S192120

Reexamination Certificate

active

07914692

ABSTRACT:
A direct current pulse voltage is applied on a treatment gas to generate a discharge plasma. The duty ratio of the direct current pulse voltage is controlled within the range of 0.0001% or more and 8.0% or less. The rise time of the direct current pulse voltage is controlled in the range of not lower than 0.1 V
sec and not higher than 10000 V
sec. Alternatively, a positive pulse and a negative pulse are applied from a single power source for performing the discharge plasma and the impurity implantation.

REFERENCES:
patent: 5763319 (1998-06-01), Ling et al.
patent: 5863831 (1999-01-01), Ling et al.
patent: 6054063 (2000-04-01), Ohtake et al.
patent: 6217704 (2001-04-01), Kitagawa
patent: 6447849 (2002-09-01), Watanabe et al.
patent: 6632482 (2003-10-01), Sheng
patent: 6670276 (2003-12-01), Suemasa et al.
patent: 6902683 (2005-06-01), Kaji et al.
patent: 2001/0031543 (2001-10-01), Ando et al.
patent: 2002/0040766 (2002-04-01), Takahashi et al.
patent: 2002/0060207 (2002-05-01), Coccio et al.
patent: 2003/0230938 (2003-12-01), Hatano et al.
patent: 2004/0161534 (2004-08-01), Saito et al.
patent: 2004/0219797 (2004-11-01), Honda et al.
patent: 2005/0230351 (2005-10-01), Tahara
patent: 2006/0156984 (2006-07-01), Nozawa et al.
patent: 2006/0157449 (2006-07-01), Takahashi et al.
patent: 2007/0175587 (2007-08-01), Saito et al.
patent: 09-312280 (1997-12-01), None
patent: 10-219456 (1998-08-01), None
patent: 2000-124190 (2000-04-01), None
patent: 2001-118830 (2001-04-01), None
patent: 2002-509641 (2002-03-01), None
patent: 2002-151295 (2002-05-01), None
patent: 2003-234331 (2003-08-01), None
patent: 2004-055362 (2004-02-01), None
patent: 2004-270022 (2004-09-01), None
patent: 2004-337345 (2004-12-01), None
patent: 3639795 (2005-01-01), None
patent: 3647303 (2005-02-01), None
patent: 2005-085586 (2005-03-01), None
patent: 2005-508068 (2005-03-01), None
patent: 2005-129484 (2005-05-01), None
patent: 2005-159049 (2005-06-01), None
patent: 3705977 (2005-08-01), None
patent: 2005-251837 (2005-09-01), None
patent: 3811681 (2006-06-01), None
patent: 2006-219748 (2006-08-01), None
patent: 2007-194110 (2007-08-01), None
patent: 2004/107430 (2004-12-01), None
U.S. Appl. No. 12/042,525, filed Mar. 5, 2008, Saito.
Saito et al., “High-Speed Synthesis of DLC Film by Using Bipolar Nanopulse Plasma Source”, Proceedings of the 112th Lecture Conference (with English translation), Oct. 5, 2005, pp. 1-7.
Saito et al., “High-Speed Synthesis of DLC Film by Using Bipolar Nanopulse Plasma Source”, Handout distributed in the Proceedings of the 112th Lecture Conference (with English translation), Oct. 5, 2005, pp. 1-28.
Saito et al., “Evaluation of nanopulse plasma and its application to DLC film deposition”, Proceedings of the Division Conference of the Institute of Electrical Engineers of Japan (with English translation), Aug. 22, 2005, pp. 1-23.
Saito et al., “Evaluation of nanopulse plasma and its application to DLC film deposition”, Handout distributed in the Proceedings of the Division Conference of the Institute of Electrical Engineers of Japan (with English translation), Aug. 22, 2005, pp. 1-50.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods of generating plasma, of etching an organic material... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods of generating plasma, of etching an organic material..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of generating plasma, of etching an organic material... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2756708

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.