Methods of forming metal layers in the fabrication of...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C257SE21586, C438S685000

Reexamination Certificate

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07547632

ABSTRACT:
A metal deposition processing apparatus includes a first processing chamber configured for holding a semiconductor substrate therein. A second processing chamber is configured for holding the semiconductor substrate therein and for forming an upper metal layer thereon. A transfer chamber is connected to the first processing chamber and the second processing chamber. The transfer chamber is configured to transfer the semiconductor substrate between the first processing chamber and the second processing chamber.

REFERENCES:
patent: 5627105 (1997-05-01), Delfino et al.
patent: 6017818 (2000-01-01), Lu
patent: 6399491 (2002-06-01), Jeon et al.
patent: 6458684 (2002-10-01), Guo et al.
patent: 6660628 (2003-12-01), Pan et al.
patent: 6740585 (2004-05-01), Yoon et al.
patent: 6800494 (2004-10-01), Castle et al.
patent: 2002/0187644 (2002-12-01), Baum et al.
Notice to File a Response for Korean patent application No. 10-2003-0045786 mailed on Apr. 26, 2005.

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