Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-08-02
2008-12-09
Booth, Richard A. (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S300000, C257SE21209
Reexamination Certificate
active
07462534
ABSTRACT:
The invention includes methods of forming memory circuitry. In one implementation, a substrate is provided which has a memory array circuitry area and a peripheral circuitry area. The memory array circuitry area comprises transistor gate lines having a first minimum line spacing. The peripheral circuitry area comprises transistor gate lines having a second minimum line spacing which is greater than the first minimum line spacing. Anisotropically etched insulative sidewall spacers are formed over opposing sidewalls of individual of said transistor gate lines within the peripheral circuitry area prior to forming anisotropically etched insulative sidewall spacers over opposing sidewalls of individual of said transistor gate lines within the memory array area. Other aspects and implementations are contemplated.
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Cole Steve
Mathew Suraj
Parekh Kunal R.
Booth Richard A.
Micro)n Technology, Inc.
Wells St. John P.S.
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