Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2005-05-10
2005-05-10
Everhart, Carldad (Department: 2825)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C438S253000, C438S254000, C438S396000, C438S397000, C257S306000, C257S303000, C257S734000, C257S908000
Reexamination Certificate
active
06890841
ABSTRACT:
An integrated circuit memory device is formed by forming an interlevel insulating layer on a substrate. A plurality of storage node contact holes are formed in the interlayer insulating layer and are arranged in a pattern. A plurality of contact plugs are formed in the plurality of storage node contact holes, respectively. A material layer is formed on the interlevel insulating layer that has a plurality of landing pad holes that expose the plurality of contact plugs, respectively, the plurality of landing pad holes are arranged in a pattern that is offset with respect to the pattern of the storage node contact holes. A plurality of landing pads are formed in the plurality of landing pad holes and are connected to the plurality of contact plugs, respectively. A plurality of storage nodes are formed that are connected to the plurality of landing pads, respectively.
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Cho Chang-hyun
Chung Tae-young
Kim Sang-bum
Lee Kyu-hyun
Park Yang-keun
Anya Igwe U.
Everhart Carldad
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
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