Methods of forming contact plugs including polysilicon doped...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S647000

Reexamination Certificate

active

06858529

ABSTRACT:
Forming a semiconductor device can include forming an insulating layer on a semiconductor substrate including a conductive region thereof, wherein the insulating layer has a contact hole therein exposing a portion of the conductive region. A polysilicon contact plug can be formed in the contact hole wherein at least a portion of the polysilicon contact plug is doped with an element having a diffusion coeffient that is less than a diffusion coefficient of phosphorus (P). Related structures are also discussed.

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patent: 5804470 (1998-09-01), Wollesen
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patent: 20030049372 (2003-03-01), Cook et al.
patent: 10-1997-0022171 (1997-05-01), None
patent: 10-0232984 (1999-12-01), None
English Translation of Korean Office Action dated Mar. 23, 2004.

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