Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-02-22
2005-02-22
Wilczewski, M. (Department: 2822)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S647000
Reexamination Certificate
active
06858529
ABSTRACT:
Forming a semiconductor device can include forming an insulating layer on a semiconductor substrate including a conductive region thereof, wherein the insulating layer has a contact hole therein exposing a portion of the conductive region. A polysilicon contact plug can be formed in the contact hole wherein at least a portion of the polysilicon contact plug is doped with an element having a diffusion coeffient that is less than a diffusion coefficient of phosphorus (P). Related structures are also discussed.
REFERENCES:
patent: 5517044 (1996-05-01), Koyama
patent: 5567644 (1996-10-01), Rolfson et al.
patent: 5792695 (1998-08-01), Ono et al.
patent: 5804470 (1998-09-01), Wollesen
patent: 6232196 (2001-05-01), Raaijmakers et al.
patent: 6243285 (2001-06-01), Kurth et al.
patent: 6274489 (2001-08-01), Ono et al.
patent: 20030049372 (2003-03-01), Cook et al.
patent: 10-1997-0022171 (1997-05-01), None
patent: 10-0232984 (1999-12-01), None
English Translation of Korean Office Action dated Mar. 23, 2004.
Chung Eun-Ae
Jin Bean-Jun
Kim Jin-Gyun
Kim Young-Pil
Lee Myoung-Bum
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
Wilczewski M.
LandOfFree
Methods of forming contact plugs including polysilicon doped... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods of forming contact plugs including polysilicon doped..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of forming contact plugs including polysilicon doped... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3505592