Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2009-07-23
2011-10-04
Everhart, Caridad (Department: 2895)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C438S567000, C257SE21085, C257SE21135
Reexamination Certificate
active
08030188
ABSTRACT:
Provided is a method of forming a compound semiconductor device. In the method, a dopant element layer is formed on an undoped compound semiconductor layer. An annealing process is performed to diffuse dopants in the dopant element layer into the undoped compound semiconductor layer, thereby forming a dopant diffusion region. A rapid cooling process is performed using liquid nitrogen with respect to the substrate having the dopant diffusion region.
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Hyesook Hong et al., “Cryogenic Processed Metal-Semiconductor-Metal (MSM) Photodetectors on MBE Grown ZnSe” IEEE Transactions on Electron Devices, vol. 46, No. 6, Jun. 1999, pp. 1127-1134.
Kwon Yong-Hwan
Mheen Bong-ki
Oh Dae Kon
Park Mi-Ran
Sim Jae-Sik
Electronics and Telecommunications Research Institute
Everhart Caridad
Rabin & Berdo P.C.
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