Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Recessed oxide by localized oxidation
Patent
1997-02-06
1999-01-12
Fourson, George
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Recessed oxide by localized oxidation
438699, 438692, 438978, H01L 276
Patent
active
058588604
ABSTRACT:
Isolated semiconductor devices are formed by forming field oxide regions in a face of a semiconductor substrate to define active regions therebetween. The field oxide regions extend to above the substrate face and include an oblique surface which extends from above the substrate face to the substrate face. A step reducing region is formed on a respective one of the oblique surfaces of the field oxide regions, extending onto the active regions at the substrate face. The step reducing region can reduce the steepness of the step between the substrate face and the field oxide regions, thereby facilitating further processing and reliability of the semiconductor devices.
REFERENCES:
patent: 4610078 (1986-09-01), Matsukawa et al.
patent: 5506168 (1996-04-01), Morita et al.
patent: 5554560 (1996-09-01), Hsue et al.
patent: 5672538 (1997-09-01), Liaw et al.
Choi Won-taek
Shim Myoung-seob
Shin Yun-Seung
Fourson George
Samsung Electronics Co,. Ltd.
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