Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Patent
1997-04-25
1999-07-20
Dutton, Brian
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
438763, 438787, G01R 3126, H01L 2166, H01L 2131, H01L 21469
Patent
active
059266910
ABSTRACT:
Borophosphosilicate glass (BPSG) films having impurity concentrations which remain stable over time are fabricated by removing moisture from a BPSG film and forming a shield film on the BPSG film to reduce reintroduction of moisture into the BPSG film. Moisture is removed from the BPSG film by annealing the BPSG film. The BPSG film may be used to test impurity concentrations in BPSG films of microelectronic devices. The BPSG films may also be used in the manufacture of microelectronic devices.
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Kim Bong-su
Lim Kyu-hong
Dutton Brian
Samsung Electronics Co,. Ltd.
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