Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Removal of imaged layers
Reexamination Certificate
2006-08-01
2006-08-01
Barreca, Nicole (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Removal of imaged layers
C430S313000, C430S315000, C430S317000, C216S062000, C216S067000, C438S725000
Reexamination Certificate
active
07083903
ABSTRACT:
Methods of etching a carbon-rich layer on organic photoresist overlying an inorganic layer can utilize a process gas including CxHyFz, where y≧x and z≧0, and one or more optional components to generate a plasma effective to etch the carbon-rich layer with low removal of the inorganic layer. The carbon-rich layer can be removed in the same processing chamber, or alternatively can be removed in a different processing chamber, as used to remove the bulk photoresist.
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Chebi Robert P.
Edelberg Erik A.
Lo Gladys Sowan
Barreca Nicole
Buchanan & Ingersoll PC
Lam Research Corporation
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