Methods for removing black silicon and black silicon carbide...

Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C156S345420, C134S001100, C134S001200, C134S001300, C216S079000

Reexamination Certificate

active

11019464

ABSTRACT:
Methods for removing black silicon or black silicon carbide from a plasma-exposed surface of an upper electrode of a plasma processing chamber are provided. The methods include forming a plasma using a gas composition containing a fluorine-containing gas, and removing the black silicon or black silicon carbide from the surface with the plasma. The methods can also remove black silicon or black silicon carbide from surfaces of the components in the chamber in addition to the upper electrode.

REFERENCES:
patent: 4426246 (1984-01-01), Kravitz et al.
patent: 4498953 (1985-02-01), Cook et al.
patent: 4595484 (1986-06-01), Giammarco et al.
patent: 5215619 (1993-06-01), Cheng et al.
patent: 5565038 (1996-10-01), Ashley
patent: 5585012 (1996-12-01), Wu et al.
patent: 5665203 (1997-09-01), Lee et al.
patent: 5865896 (1999-02-01), Nowak et al.
patent: 5888906 (1999-03-01), Sandhu et al.
patent: 6033997 (2000-03-01), Perng
patent: 6090304 (2000-07-01), Zhu et al.
patent: 6090718 (2000-07-01), Soga et al.
patent: 6124211 (2000-09-01), Butterbaugh et al.
patent: 6162367 (2000-12-01), Tai et al.
patent: 6290779 (2001-09-01), Saleh et al.
patent: 6391788 (2002-05-01), Khan et al.
patent: 6394104 (2002-05-01), Chen et al.
patent: 6489249 (2002-12-01), Mathad et al.
patent: 6500356 (2002-12-01), Goto et al.
patent: 6503842 (2003-01-01), Sandhu et al.
patent: 6514378 (2003-02-01), Ni et al.
patent: 6527911 (2003-03-01), Yen et al.
patent: 6559049 (2003-05-01), Chen et al.
patent: 6635185 (2003-10-01), Demmin et al.
patent: 6730600 (2004-05-01), Layadi et al.
patent: 6776851 (2004-08-01), Singh et al.
patent: 6888224 (2005-05-01), Kane et al.
patent: 2003/0190814 (2003-10-01), Kumar et al.
patent: 2004/0112294 (2004-06-01), Allen et al.
patent: 2005/0001276 (2005-01-01), Gao et al.
S. Wolf and R.N. Tauber, (Silicon Processing for the VLSI Era, vol. 1- Process Technology, Lattice Press, 1986) pp. 540-541, 545□□, 542,546-547.
Jeon et al. (Cleaning of wafer edges, bevel and back-side with torus-shaped capacitively coupled plasma, Plasma Sources Sci. Technol. 11 (2002) pp. 520-524 □□.
Jansen et al. (“The Black Silicon Method” Journal Micromechanical Microengineering, 5 (1995) pp. 115-120) □□.
Jansen et al. (J. Micromech. Microeng. 5 (1995) pp. 115-120.
Ibbotson, D.E., et al. “Plasmaless dry etching of silicon with fluorine-containing compounds,” J. Appl Phys 56 (10), Nov. 15, 1984, pp. 2939-2942.
Ibbotson, D.E., et al. “Selective interhalogen etching of tantalum compounds and other semiconductor materials,” Appl. Phys. Lett. 46 (8), Apr. 15, 1985, pp. 794-796.
Yaws, Carl L.,The Matheson Gas Data Book, 7thedition, McGraw-Hill (2001).
International Search Report and Written Opinion dated Oct. 27, 2006 for PCT/US05/45541.
International Preliminary Report on Patenability dated Jun. 26, 2007 for PCT/US2005/45541.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods for removing black silicon and black silicon carbide... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods for removing black silicon and black silicon carbide..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods for removing black silicon and black silicon carbide... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3849949

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.