Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Patent
1996-09-10
2000-02-22
Niebling, John F.
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
438585, 438652, H01L 2144
Patent
active
060280050
ABSTRACT:
A method for fabricating an integrated circuit device includes the steps of forming first and second conductive regions on a substrate. The second conductive region is divided into first and second subregions wherein the first subregion is adjacent the first conductive region. More particularly, the surface area of the first subregion is not more than ten times greater than the surface area of the first conductive region. The first and second subregions can then be electrically connected to complete the second conductive region. Related structures are also discussed.
REFERENCES:
patent: 4990980 (1991-02-01), Wada
patent: 5424857 (1995-06-01), Aoki et al.
patent: 5612546 (1997-03-01), Choi et al.
patent: 5717254 (1998-02-01), Hashimoto
patent: 5828101 (1998-10-01), Endo
Murphy John
Niebling John F.
Samsung Electronics Co,. Ltd.
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