Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-03-22
2011-03-22
Nguyen, Hoai-An D (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S663000
Reexamination Certificate
active
07911213
ABSTRACT:
A method is disclosed for calibrating a capacitance of an apparatus for measuring dielectric properties of a part. The apparatus includes an electrically grounded chamber, a lower electrode disposed within the chamber and connected to a radiofrequency (RF) transmission rod, an electrically grounded upper electrode disposed within the chamber above the lower electrode, and a variable capacitor connected to control transmission of RF power through the RF transmission rod to the lower electrode. A method is also disclosed for determining a capacitance of a part through use of the apparatus. A method is also disclosed for determining a dielectric constant of a part through use of the apparatus. A method is also disclosed for determining a loss tangent of a part through use of the apparatus.
REFERENCES:
patent: 4448943 (1984-05-01), Golba et al.
patent: 5396806 (1995-03-01), Dechene et al.
patent: 5528153 (1996-06-01), Taylor et al.
patent: 5874832 (1999-02-01), Gabelich
patent: 2003/0231024 (2003-12-01), Luque
Comendant Keith
Kim Jae-hyun
Liu Qing
Sato Arthur H.
Wu Feiyang
Lam Research Corporation
Martine & Penilla & Gencarella LLP
Nguyen Hoai-An D
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