Semiconductor device manufacturing: process – Making field effect device having pair of active regions...
Reexamination Certificate
2006-03-20
2009-02-10
Luu, Chuong A. (Department: 2892)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
C438S003000, C438S240000, C438S239000, C438S253000
Reexamination Certificate
active
07488628
ABSTRACT:
Pursuant to embodiments of the present invention, ferroelectric memory devices are provided which comprise a transistor that is provided on an active region in a semiconductor substrate, and a capacitor that has a bottom electrode, a capacitor-ferroelectric layer and a top electrode. These devices may further include at least one planarizing layer that is adjacent to the side surfaces of the bottom electrode such that the top surface of the planarizing layer(s) and the top surface of the bottom electrode form a planar surface. The capacitor-ferroelectric may be formed on this planar surface. The device may also include a plug that electrically connects the bottom electrode to a source-drain region of the transistor. The ferroelectric memory devices according to embodiments of the present invention may reduce ferroelectric degradation of the capacitor.
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Notice to File Response, Korean Application No. 10-2003-0008202, mailed Dec. 17, 2004.
Jang Nak-Won
Kim Ki-Nam
Song Yoon-Jong
Luu Chuong A.
Meyers Bigel Sibley & Sajovec
Samsung Electronics Co,. Ltd.
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