Static information storage and retrieval – Read/write circuit – Testing
Patent
1996-04-29
1997-02-25
Zarabian, Amir
Static information storage and retrieval
Read/write circuit
Testing
36518517, G11C 700
Patent
active
056065272
ABSTRACT:
Alternative methods for detecting a short-circuit between signal lines in an electrically erasable and programmable nonvolatile semiconductor memory device use circuitry for detecting short-circuited signal lines. One method includes the steps of: floating first and second signal lines in response to another external input; simultaneously forming an electrical path between the first and second signal lines and each test pad; and determining whether a current path is formed between the test pads, for detecting any short-circuit between the first and second signal lines. Another method includes the steps of: floating the first and second signal lines in response to another external input; simultaneously forming the electrical path between the first signal line and the test pad while discharging the second signal line to the reference potential; and determining whether a current path is formed from the test pad to the reference potential, for detecting any short-circuit between the first and second signal lines.
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Kwack Jin-ho
Lee Woung-Moo
Limberg Allen LeRoy
Samsung Electronics Co,. Ltd.
Zarabian Amir
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