Methods and circuits for programming addresses of failed...

Static information storage and retrieval – Read/write circuit – Bad bit

Reexamination Certificate

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C365S201000, C365S225700

Reexamination Certificate

active

07339843

ABSTRACT:
A method of programming addresses of failed memory locations in a memory device can be provided by generating a plurality of fail address signals corresponding to a plurality of addresses of failed memory locations in the memory device and then programming the plurality of addresses of failed memory locations to programming cells for use by a redundant circuit during read or write operations to the plurality of addresses of failed memory locations.

REFERENCES:
patent: 6829176 (2004-12-01), Callaway et al.
patent: 2002/0012282 (2002-01-01), Saito et al.
patent: 2003/0213954 (2003-11-01), Fujima
patent: 2004/0136248 (2004-07-01), Kozuka
patent: 2002042494 (2002-02-01), None
patent: 1020020058488 (2002-07-01), None

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