Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-09-12
2010-12-21
Kerveros, James C (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S724000
Reexamination Certificate
active
07856581
ABSTRACT:
Various methods and apparatuses are described for a system that includes some on-chip components, e.g., I-Os, test processors, soft wrappers, etc., an external testing unit that provides Parametric Measurement Unit (PMU) capability, and various tests performed on the I-Os by the on-chip testing logic, the test vector patterns supplied by the external testing unit.
REFERENCES:
patent: 5062122 (1991-10-01), Pham et al.
patent: 5101153 (1992-03-01), Morong, III
patent: 5670890 (1997-09-01), Colwell et al.
patent: 5915105 (1999-06-01), Farmwald et al.
patent: 5923676 (1999-07-01), Sunter et al.
patent: 5954804 (1999-09-01), Farmwald et al.
patent: 5995443 (1999-11-01), Farmwald et al.
patent: 6011732 (2000-01-01), Harrison et al.
patent: 6026216 (2000-02-01), Ohtsuka et al.
patent: 6032214 (2000-02-01), Farmwald et al.
patent: 6035365 (2000-03-01), Farmwald et al.
patent: 6044426 (2000-03-01), Farmwald et al.
patent: 6049846 (2000-04-01), Farmwald et al.
patent: 6058496 (2000-05-01), Gillis et al.
patent: 6075614 (2000-06-01), Ohtsuka et al.
patent: 6085284 (2000-07-01), Farmwald et al.
patent: 6100735 (2000-08-01), Lu
patent: 6101152 (2000-08-01), Farmwald et al.
patent: 6107826 (2000-08-01), Young et al.
patent: 6166563 (2000-12-01), Volk et al.
patent: 6173432 (2001-01-01), Harrison
patent: 6260163 (2001-07-01), Lacroix et al.
patent: 6260263 (2001-07-01), Haase
patent: 6262585 (2001-07-01), Frodsham et al.
patent: 6327685 (2001-12-01), Koprowski et al.
patent: 6348811 (2002-02-01), Haycock et al.
patent: 6348826 (2002-02-01), Mooney et al.
patent: 6384781 (2002-05-01), Kautz et al.
patent: 6397361 (2002-05-01), Saitoh
patent: 6421801 (2002-07-01), Maddux et al.
patent: 6425097 (2002-07-01), Elachkar et al.
patent: 6429715 (2002-08-01), Bapat et al.
patent: 6445231 (2002-09-01), Baker et al.
patent: 6449738 (2002-09-01), Hinedi et al.
patent: 6452432 (2002-09-01), Kim
patent: 6455332 (2002-09-01), Singh et al.
patent: 6476652 (2002-11-01), Lee et al.
patent: 6477674 (2002-11-01), Bates et al.
patent: 6483360 (2002-11-01), Nakamura
patent: 6486919 (2002-11-01), Kim
patent: 6492798 (2002-12-01), Sunter
patent: 6492851 (2002-12-01), Watarai
patent: 6502050 (2002-12-01), Chan
patent: 6556934 (2003-04-01), Higashide
patent: 6580304 (2003-06-01), Rieven
patent: 6586921 (2003-07-01), Sunter
patent: 6618133 (2003-09-01), Hedges et al.
patent: 6629274 (2003-09-01), Tripp et al.
patent: 6639426 (2003-10-01), Haycock et al.
patent: 6657936 (2003-12-01), Harvey et al.
patent: 6671847 (2003-12-01), Chao et al.
patent: 6691269 (2004-02-01), Sunter
patent: 6694441 (2004-02-01), Sethia
patent: 6700670 (2004-03-01), Poris
patent: 6711718 (2004-03-01), Pfeil et al.
patent: 6721920 (2004-04-01), Rearick et al.
patent: 6731128 (2004-05-01), Das et al.
patent: 6748549 (2004-06-01), Chao et al.
patent: 6750688 (2004-06-01), Takai
patent: 6754613 (2004-06-01), Tabatabaei et al.
patent: 6760873 (2004-07-01), Hao et al.
patent: 6760899 (2004-07-01), Young et al.
patent: 6772620 (2004-08-01), Poris
patent: 6774694 (2004-08-01), Stern et al.
patent: 6777995 (2004-08-01), Harrison
patent: 6795046 (2004-09-01), Janssen et al.
patent: 6823500 (2004-11-01), Ganesh et al.
patent: 6832361 (2004-12-01), Cohn et al.
patent: 6839860 (2005-01-01), Lin
patent: 6850871 (2005-02-01), Barford et al.
patent: 6857080 (2005-02-01), Liang
patent: 6862705 (2005-03-01), Nesbitt et al.
patent: 6865135 (2005-03-01), Choi
patent: 6900679 (2005-05-01), Watarai
patent: 6914852 (2005-07-01), Choi
patent: 6934215 (2005-08-01), Chung et al.
patent: 6985648 (2006-01-01), Kish et al.
patent: 6986085 (2006-01-01), Rearick et al.
patent: 6993318 (2006-01-01), McNew et al.
patent: 6996032 (2006-02-01), Ganry
patent: 7032145 (2006-04-01), Burlison
patent: 7043109 (2006-05-01), Kish et al.
patent: 7053992 (2006-05-01), LaBelle et al.
patent: 7062114 (2006-06-01), Webjorn et al.
patent: 7129476 (2006-10-01), Ishitsu et al.
patent: 7133793 (2006-11-01), Ely et al.
patent: 7142873 (2006-11-01), McNew et al.
patent: 7148763 (2006-12-01), Sutardja
patent: 7159159 (2007-01-01), Sunter
patent: 7161397 (2007-01-01), Lee et al.
patent: 7181704 (2007-02-01), Downs et al.
patent: 7199625 (2007-04-01), Chung
patent: 7202719 (2007-04-01), Gabato et al.
patent: 7206710 (2007-04-01), Zhou et al.
patent: 7219282 (2007-05-01), Sunter et al.
patent: 7254729 (2007-08-01), Matsushima et al.
patent: 7256600 (2007-08-01), Walker et al.
patent: 7262623 (2007-08-01), Mark et al.
patent: 7272764 (2007-09-01), Rich et al.
patent: 7283694 (2007-10-01), Welch et al.
patent: 7286644 (2007-10-01), Andrews
patent: 7312438 (2007-12-01), Ishitsu et al.
patent: 7340122 (2008-03-01), Welch et al.
patent: 7401493 (2008-07-01), Forrest
patent: 7414707 (2008-08-01), LaBelle et al.
patent: 7460742 (2008-12-01), Joyner
patent: 7640468 (2009-12-01), Linam et al.
patent: 2001/0024135 (2001-09-01), Harrison
patent: 2001/0026183 (2001-10-01), Kim
patent: 2001/0030553 (2001-10-01), Aihara
patent: 2001/0035784 (2001-11-01), Watarai
patent: 2002/0015460 (2002-02-01), Bhullar et al.
patent: 2002/0027461 (2002-03-01), Kusunoki
patent: 2002/0036526 (2002-03-01), Nakamura
patent: 2002/0041196 (2002-04-01), Demone et al.
patent: 2002/0057624 (2002-05-01), Manning
patent: 2002/0153914 (2002-10-01), Arabi et al.
patent: 2002/0154723 (2002-10-01), Nakamura
patent: 2002/0157031 (2002-10-01), Lin
patent: 2003/0001638 (2003-01-01), Watarai
patent: 2003/0005374 (2003-01-01), Fought et al.
patent: 2003/0030461 (2003-02-01), Oberle et al.
patent: 2003/0067333 (2003-04-01), Nakamura
patent: 2003/0071606 (2003-04-01), Sunter
patent: 2003/0099321 (2003-05-01), Juan et al.
patent: 2003/0151433 (2003-08-01), Takai
patent: 2003/0196153 (2003-10-01), Evans
patent: 2003/0199262 (2003-10-01), Chung
patent: 2003/0208708 (2003-11-01), Sunter
patent: 2004/0027993 (2004-02-01), Ghiasi et al.
patent: 2004/0051551 (2004-03-01), Sunter
patent: 2004/0062121 (2004-04-01), Chung et al.
patent: 2004/0098648 (2004-05-01), Sunter
patent: 2004/0109464 (2004-06-01), Seo et al.
patent: 2004/0119455 (2004-06-01), Sunter
patent: 2004/0123197 (2004-06-01), Sunter
patent: 2004/0153931 (2004-08-01), Cao et al.
patent: 2004/0179640 (2004-09-01), Jacob et al.
patent: 2004/0186675 (2004-09-01), Larson et al.
patent: 2004/0196064 (2004-10-01), Garlepp et al.
patent: 2004/0221197 (2004-11-01), Goyal et al.
patent: 2004/0223571 (2004-11-01), Donnelly et al.
patent: 2004/0246017 (2004-12-01), Arabi et al.
patent: 2005/0007157 (2005-01-01), Harrison
patent: 2005/0025190 (2005-02-01), Frisch
patent: 2006/0132164 (2006-06-01), Walker et al.
patent: 2006/0132165 (2006-06-01), Walker et al.
patent: 2006/0279310 (2006-12-01), Walker et al.
Non-Final Office Action for U.S. Appl. No. 11/340,147 mailed Sep. 26, 2007, 7 pages.
Adham, Saman, et al., “Preliminary Outline of the IEEE P1500 Scaleable Architecture for Testing Embedded Cores,” IEEE P1500 Architecture Task Force, 1999, 6 pages.
Arkin, Brian, “Realizing a Production ATE Custom Processor and Timing IC Containing 400 Independent Low-Power and High-Linearity Timing Verniers,” IEEE International Solid-State Circuits Conference, Feb. 2004.
Bonnett, David, “IEEE 1149.1 yields new standards,” Test & Measurement World, http://www.reed-electronics.com/tmworld/article/CA202501.html, Apr. 2002.
Christiansen, Jorgen, “An Integrated High Resolution CMOS Timing Generator Based on an Array of Delay Locked Loops,” IEEE Journal of Solid State Circuits, Jul. 1996, pp. 952-957, 31:7.
Gillis, Pamela, et al, “Delay Test of Chip I/Os Using LSSD Boundary Scan,” IEEE International Test Conference, Aug. 1998, pp. 83-90, Paper 4.1.
Hwang, Chorng-Sii, et al, “A High-Precision Time-to-Digital Converter Using a Two-Level Conversion Scheme,” IEEE Transactions on Nuclear Science, Aug. 2004, pp. 1349-1352, 51:4.
Kuo, Andy, et al, “Jitter Models and Measurement Methods for High-Speed Serial Interconnects,” ITC International Test Conference, Feb. 2004, pp. 1295-1302, Paper 46.1.
Kuo, Andy, et al, “Crosstalk Bo
Tabatabaei Sassan
Zorian Yervant
Kerveros James C
Rutan & Tucker, LLP.
Synopsys Inc.
LandOfFree
Methods and apparatuses for external test methodology and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods and apparatuses for external test methodology and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and apparatuses for external test methodology and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4160567