Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2008-01-22
2008-01-22
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
10959857
ABSTRACT:
In one embodiment, an electronic device is tested using automated test equipment (ATE) by 1) storing different vectors of scan load data in memory of the ATE; 2) storing a scan unload subroutine in the memory of the ATE; 3) stimulating the electronic device by retrieving the different vectors of scan load data and applying them to the electronic device; and 4) capturing responses to the different vectors by repeatedly calling the scan unload subroutine, and in response thereto, storing different vectors of scan unload data in the memory.
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Chindamo Domenico
Salagianis Ariadne
Britt Cynthia
Radosevich Steven D.
Verigy (Singapore Pte. Ltd.
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