Methods and apparatus for programming and operating...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Reexamination Certificate

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07321999

ABSTRACT:
In one embodiment, an electronic device is tested using automated test equipment (ATE) by 1) storing different vectors of scan load data in memory of the ATE; 2) storing a scan unload subroutine in the memory of the ATE; 3) stimulating the electronic device by retrieving the different vectors of scan load data and applying them to the electronic device; and 4) capturing responses to the different vectors by repeatedly calling the scan unload subroutine, and in response thereto, storing different vectors of scan unload data in the memory.

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