Methods and apparatus for patternizing device responses

Details Methods and apparatus for patternizing device responses Methods and apparatus for patternizing device responses

2008-12-18

2010-02-09

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07661053

ABSTRACT:
A device response template generator software program includes an interactive graphical-user-interface (GUI) for sending commands to devices under test and to capture and display the command responses. The GUI enables patternization of the command response to that the information contained in the response can be read, in the form of variable values, automatically, during subsequent execution of the commands by the same device or a group of devices. These values of the variables may be analyzed and may also be sent to other running testing scenarios.

REFERENCES:
patent: 5854889 (1998-12-01), Liese et al.
patent: 6158031 (2000-12-01), Mack et al.
patent: 6654911 (2003-11-01), Miles
patent: 6892154 (2005-05-01), Lee
patent: 7010782 (2006-03-01), Narayan et al.
patent: 7055138 (2006-05-01), Sutton
patent: 7237161 (2007-06-01), Volz
patent: 7284177 (2007-10-01), Hollander et al.
patent: 2002/0162059 (2002-10-01), McNeely et al.
patent: 2003/0208616 (2003-11-01), Laing et al.
patent: 2004/0073890 (2004-04-01), Johnson et al.
patent: 2004/0205406 (2004-10-01), Kaliappan et al.
patent: 2007/0208984 (2007-09-01), Hayhow et al.
patent: 2007/0220392 (2007-09-01), Bhaumik et al.

Affiliated with

Also associated with

Rating

Methods and apparatus for patternizing device responses does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods and apparatus for patternizing device responses, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and apparatus for patternizing device responses will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4194778