Methods and apparatus for isolating critical paths on an IC...

Details Methods and apparatus for isolating critical paths on an IC... Methods and apparatus for isolating critical paths on an IC...

2005-05-17

2005-05-17

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C714S725000, C714S726000

Reexamination Certificate

active

06895566

ABSTRACT:
Test methods and circuits isolate thermal effects from AC effects on circuit performance. Critical paths for a failing programmable logic device (PLD) are identified and tested. This testing minimizes the impact of power-supply flicker and noise by eliminating or inactivating circuitry not required to test the critical paths. DC thermal energy generators are instantiated on the PLD adjacent the critical paths to heat the critical paths to one or more test temperatures. The critical paths are then tested over an appropriate range of temperatures and supply-voltages.

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