Method to improve internal package delamination and wire bond re

Active solid-state devices (e.g. – transistors – solid-state diode – Encapsulated – With specified encapsulant

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257789, 257795, 257788, 257784, 257666, 257787, 438124, 438127, 438123, H01L 2329

Patent

active

060911573

ABSTRACT:
Method for implementing a multi-phase plastic package for electronic components, and packaged electronic components produced according to the method. The present invention contemplates the use of molding compounds having two or more discrete phases in a transfer molding process wherein a temperature differential is induced between the electronic component to be packaged and the mold of the molding apparatus prior to molding. Each of the molding compound phases, when used in a current transfer molding apparatus, generates a separate layer in the resultant package, and each of the resultant layers possesses certain unique properties. In its simplest implementation, the present invention provides a two-phase molding compound pellet which provides an outer layer containing mold release compounds to facilitate release of the completed packaged device from the mold, and an inner layer without mold release agents. Other implementations include multiple layers. One such implementation provides for an inner layer without flame retardants and a layer exterior to the inner layer containing flame retardants. In this manner, chemical interaction between the flame retardants and the encapsulated device is precluded. Other adjuncts may, with equal facility, be implemented in such additional layers as a given application may require.

REFERENCES:
patent: 5097317 (1992-03-01), Fujimoto et al.
patent: 5641997 (1997-06-01), Ohta et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method to improve internal package delamination and wire bond re does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method to improve internal package delamination and wire bond re, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method to improve internal package delamination and wire bond re will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2039686

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.