Method to improve electrical leakage performance and to...

Details Method to improve electrical leakage performance and to... Method to improve electrical leakage performance and to...

2011-07-19

2011-07-19

Padgett, Marianne L (Department: 1717)

Coating processes

Direct application of electrical, magnetic, wave, or...

Ion plating or implantation

C427S529000, C427S527000, C427S530000, C250S492210, C438S474000, C438S766000, C438S798000

Reexamination Certificate

active

07981483

ABSTRACT:
Embodiments of methods for improving electrical leakage performance and minimizing electromigration in semiconductor devices are generally described herein. Other embodiments may be described and claimed.

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