Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2005-11-01
2005-11-01
Iqbal, Nadeem (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S033000, C714S037000, C714S039000
Reexamination Certificate
active
06961871
ABSTRACT:
A software and hardware system and an associated methodology provides ATE-independent go
o-go testing as well as advanced failure diagnosis of integrated circuits for silicon debug, process characterization, production (volume) testing, and system diagnosis comprises an embedded test architecture designed within an integrated circuit; means for seamlessly transferring information between the integrated circuit and its external environment; and an external environment that effectuates the seamless transfer for the user to perform relevant test and diagnosis.
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Bell Martin J.
Danialy Givargis A.
Howells Michael C.
Mc Donald Charles
Pateras Stephen V.
Bonura Timothy M.
Iqbal Nadeem
LogicVision, Inc.
Prouix Eugene E.
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