Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-06-14
2008-08-12
Tu, Christine T (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S726000, C714S732000
Reexamination Certificate
active
07412638
ABSTRACT:
A method of controlling test data with a boundary latch module having a plurality of latches to facilitate logic built-in self-testing of an integrated circuit (IC) is provided which includes providing a plurality of selection devices for selecting initialization data to store in the plurality of latches of the IC's boundary latch module. The initialization data is selected from a plurality of scan paths of the integrated circuit, and the initialization data from at least one of the latches is provided as input to a logic circuit of the IC or output of the IC. In another aspect, the method includes selecting a datum from an external input or test-pattern generator of the integrated circuit for capture in at least one of the latches and input to a multiple-input signature register, which stores a signature of the integrated circuit resulting from the logic built-in self-testing.
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Herring Jay R.
Rich Marvin J.
Campbell, Esq. John E.
Heslin Rothenberg Farley & & Mesiti P.C.
International Business Machines - Corporation
Radigan, Esq. Kevin P.
Tu Christine T
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