Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-06-18
2008-08-05
Tu, Christine T (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S732000
Reexamination Certificate
active
07409614
ABSTRACT:
A testing method is provided which includes verifying at least one external signal path of an electronic package environment by testing an input/output (I/O) circuit of an integrated circuit of the electronic package environment with a logic built-in self-test (LBIST) of the integrated circuit, wherein the external signal path being verified is electrically coupled to the tested I/O circuit. A result of verifying of the at least one external signal path is manifested in the integrated circuit's signature, which characterizes a response of the I/O circuit to the LBIST. In another aspect, the verifying of the at least one external signal path includes concurrently testing another I/O circuit of another integrated circuit, which is also electrically coupled to the external signal path.
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Herring Jay R.
Rich Marvin J.
Campbell, Esq. John E.
Heslin Rothenberg Farley & & Mesiti P.C.
International Business Machines - Corporation
Radigan, Esq. Kevin P.
Tu Christine T
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