Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-03-07
2006-03-07
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07010770
ABSTRACT:
A method for analyzing a cell definition comprises the steps of: identifying at least one connectivity target in at least one cell definitions identifying at least one circuit path in the at least one cell definition, the at least one circuit path containing or connected to a circuit portion containing the at least one connectivity target of the cell definition; predicting a routing path to be used by a router to connect a connectivity target in the at least one cell definition to another structure; and determining whether a combination of the predicted routing path and the circuit path causes a violation of an integrated circuit design rule.
REFERENCES:
patent: 5331572 (1994-07-01), Takahashi
patent: 5479357 (1995-12-01), Yoshimura
patent: 6260179 (2001-07-01), Ohsawa et al.
patent: 6301689 (2001-10-01), Darden
patent: 6330707 (2001-12-01), Shinomiya et al.
patent: 6629305 (2003-09-01), Ito et al.
Mentor Graphics Corporation, Basic Rules for Calibre LVS Training Workbook, Software Version 8.6—2, Copyright 1997, 125 pages.
Huang Mu-Jen
Liang Eric
Duane Morris LLP
Garbowski Leigh M.
Koffs Steven E.
Taiwan Semiconductor Manufacturing Co. Ltd.
LandOfFree
Method of wide wire identification does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of wide wire identification, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of wide wire identification will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3597947