Method of testing PRAM device

Details Method of testing PRAM device Method of testing PRAM device

2011-01-11

2011-01-11

Lam, David (Department: 2827)

Static information storage and retrieval

Systems using particular element

Amorphous

C365S200000, C365S201000, C365S230030

Reexamination Certificate

active

07869271

ABSTRACT:
A method of testing PRAM devices is disclosed. The method simultaneously writes input data to a plurality of memory banks by writing set data to a first group of memory banks and writing reset data to a second group of memory banks, performs a write operation test by comparing data read from the plurality of memory banks with corresponding input data, and determines a fail cell in relation to the test results.

REFERENCES:
patent: 6487113 (2002-11-01), Park et al.
patent: 6687153 (2004-02-01), Lowrey
patent: 7206216 (2007-04-01), Osada et al.
patent: 7324371 (2008-01-01), Khouri et al.
patent: 7522449 (2009-04-01), Ro et al.
patent: 7529124 (2009-05-01), Cho et al.

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