Method of testing multiple modules on an integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S726000, C714S742000

Reexamination Certificate

active

10439345

ABSTRACT:
An integrated circuit (20) comprises a plurality of processing modules (3, 5, 7) which interact during the normal operation of the integrated circuit. Switches (13, 15) are provided on the integrated circuit (20) and operated during a testing procedure to isolate a single module (3) or a group of modules (5, 7) from the other modules, so that that the isolated module or group of modules can be tested. During the testing procedure, the switches (13, 15) provide defined signals at inputs of the isolated module(s) which, when the integrated circuit is in normal operation, are controlled by outputs of the other modules.

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patent: 2003/0056164 (2003-03-01), Lauga

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