Method of testing memory with continuous, varying data

Details Method of testing memory with continuous, varying data Method of testing memory with continuous, varying data

2006-07-04

2006-07-04

Lamarre, Guy (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

Reexamination Certificate

active

07073101

ABSTRACT:
A method of testing memory using continuous, varying data. More specifically, a method for testing whether a memory is weakened or damaged by continuously inputting and outputting varying data through the data I/O pins of the memory. At least a 75% data variation ratio on the test data is maintained to ensure high accuracy in detecting a weakened or damaged memory.

REFERENCES:
patent: 4335457 (1982-06-01), Early
patent: 4901264 (1990-02-01), Hayashi
patent: 6345372 (2002-02-01), Dieckmann et al.
patent: 6647521 (2003-11-01), Matsui

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