Method of testing a memory module and hub of the memory module

Details Method of testing a memory module and hub of the memory module Method of testing a memory module and hub of the memory module

2008-09-30

2010-12-07

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S731000, C714S715000, C714S025000, C714S030000, C714S042000, C714S048000, C714S719000, C714S733000, C714S734000, C714S735000, C714S736000, C714S742000, C330S253000, C330S255000, C330S051000, C326S086000, C326S127000, C327S307000, C365S201000

Reexamination Certificate

active

07849373

ABSTRACT:
Example embodiments relate to a method and system of testing a memory module having the process of receiving single ended input signals via differential input terminals through which differential pairs of packet signals may be received from a testing equipment, wherein a number of terminals of the testing equipment may be different from a number of terminals of the memory module, and testing memory chips of the memory module based on the single ended input signals.

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