Method of testing a memory module and hub of the memory module

Details Method of testing a memory module and hub of the memory module Method of testing a memory module and hub of the memory module

2005-05-02

2008-11-04

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S042000, C714S005110, C714S025000, C714S739000, C714S719000, C714S742000, C710S022000, C711S105000, C370S241000, C365S201000

Reexamination Certificate

active

07447954

ABSTRACT:
A method of testing a memory module comprising converting a hub of the memory module into a transparent mode, providing first data corresponding to a first address to the hub of the memory module, providing the first data of the hub of the memory module to a first address of a memory, providing first expected data to the hub of the memory module, outputting second data stored at the first address of the memory to the hub of the memory module, and comparing the second data with the first expected data.

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