Method of reducing sensitivity of EUV photoresists to...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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Reexamination Certificate

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07459260

ABSTRACT:
A modified EUV photoresist and a method of making the resist. The modified resist includes an EUV photoresist and a LAM incorporated into the EUV photoresist.

REFERENCES:
patent: 6656660 (2003-12-01), Urano et al.
patent: 2002/0021425 (2002-02-01), Janssen et al.
patent: 2005/0053861 (2005-03-01), Yoneda et al.
William Reusch, Visible and Ultraviolet Spectroscopy, May 10, 2004 http://www.cem.msu.edu/˜reusch/VirtualText/Spectrpy/UV-Vis/spectrum.htm.

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