Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Multiple layers
Reexamination Certificate
2006-09-12
2011-11-08
Bryant, Kiesha (Department: 2822)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Multiple layers
C438S765000, C427S255230, C427S535000, C427S570000
Reexamination Certificate
active
08053372
ABSTRACT:
The present invention relates to an enhanced cyclic deposition process suitable for deposition of barrier layers, adhesion layers, seed layers, low dielectric constant (low-k) films, high dielectric constant (high-k) films, and other conductive, semi-conductive, and non-conductive films. The deposition enhancement is derived from ions generated in a plasma. The techniques described reduce the time required for plasma stabilization, thereby reducing deposition time and improving efficiency.
REFERENCES:
patent: 4058430 (1977-11-01), Suntola et al.
patent: 4389973 (1983-06-01), Suntola et al.
patent: 4895107 (1990-01-01), Yano et al.
patent: 4900582 (1990-02-01), Nakayama et al.
patent: 4975252 (1990-12-01), Nishizawa et al.
patent: 4985657 (1991-01-01), Campbell
patent: 5420076 (1995-05-01), Lee et al.
patent: 5438587 (1995-08-01), Kinley
patent: 5545443 (1996-08-01), Yamada et al.
patent: 5711811 (1998-01-01), Suntola et al.
patent: 5820664 (1998-10-01), Gardiner et al.
patent: 5916365 (1999-06-01), Sherman
patent: 5939150 (1999-08-01), Stelzle et al.
patent: 6015590 (2000-01-01), Suntola et al.
patent: 6060130 (2000-05-01), Kim
patent: 6200893 (2001-03-01), Sneh
patent: 6238739 (2001-05-01), Madar
patent: 6265311 (2001-07-01), Hautala et al.
patent: 6267074 (2001-07-01), Okumura
patent: 6335063 (2002-01-01), Chen et al.
patent: 6368678 (2002-04-01), Bluck et al.
patent: 6368954 (2002-04-01), Lopatin et al.
patent: 6416822 (2002-07-01), Chiang et al.
patent: 6428859 (2002-08-01), Chiang et al.
patent: 6459501 (2002-10-01), Holmes
patent: 6464779 (2002-10-01), Powell et al.
patent: 6472023 (2002-10-01), Wu et al.
patent: 6475276 (2002-11-01), Elers et al.
patent: 6482262 (2002-11-01), Elers et al.
patent: 6511539 (2003-01-01), Raaijmakers
patent: 6518195 (2003-02-01), Collins et al.
patent: 6569501 (2003-05-01), Chiang et al.
patent: 6576053 (2003-06-01), Kim
patent: 6576534 (2003-06-01), Zhang et al.
patent: 6589886 (2003-07-01), Kim et al.
patent: 6627268 (2003-09-01), Fair et al.
patent: 6635571 (2003-10-01), Joo et al.
patent: 6649465 (2003-11-01), Iijima et al.
patent: 6720260 (2004-04-01), Fair et al.
patent: 6759081 (2004-07-01), Huganen et al.
patent: 6800542 (2004-10-01), Kim
patent: 6849122 (2005-02-01), Fair
patent: 6878402 (2005-04-01), Chiang et al.
patent: 6949450 (2005-09-01), Chiang et al.
patent: 7166233 (2007-01-01), Johnson et al.
patent: 7264846 (2007-09-01), Chang et al.
patent: 7399357 (2008-07-01), Sherman
patent: 7422986 (2008-09-01), Carpenter et al.
patent: 7871678 (2011-01-01), Greer et al.
patent: 7897215 (2011-03-01), Fair et al.
patent: 2001/0048981 (2001-12-01), Suzuki
patent: 2002/0076507 (2002-06-01), Chiang
patent: 2002/0104481 (2002-08-01), Chiang et al.
patent: 2002/0197402 (2002-12-01), Chiang et al.
patent: 2003/0161969 (2003-08-01), Hilliard
patent: 2006/0196418 (2006-09-01), Lindfors et al.
patent: 2010/0055342 (2010-03-01), Chiang et al.
patent: 0015 390 (1985-09-01), None
patent: WO 96/17969 (1996-06-01), None
patent: WO 99/01595 (1999-01-01), None
U.S. Appl. No. 60/251,795, “Method and apparatus for improved temperature control in atomic layer”, Chiang et al., filed Dec. 6, 2000.
U.S. Appl. No. 11/520,455, Office Action mailed Oct. 14, 2008.
U.S. Appl. No. 11/520,455, “Method of Increasing the Reactivity of a Precursor in a Cyclic Deposition Process,” Greer et al., filed Sep. 12, 2006.
U.S. Appl. No. 11/498,949, Office Action mailed Feb. 17, 2009.
U.S. Appl. No. 11/498,949, Office Action mailed Jul. 1, 2008.
U.S. Appl. No. 11/498,949, “Method of Depositing an elemental film”, filed Aug. 2, 2006.
U.S. Appl. No. 11/540,937, Office Action mailed Dec. 29, 2008.
U.S. Appl. No. 11/540,937, “Method for Improving The Nucleation and Morphology of Ruthenium Liners Deposited on Tantalum Nitride,” Gopinath et al., filed Sep. 29, 2006.
U.S. Appl. No. 10/465,721, Examiner's Answer mailed Apr. 2, 2009.
U.S. Appl. No. 10/465,721, Office Action mailed Apr. 22, 2008.
U.S. Appl. No. 10/465,721, Office Action mailed Oct. 11, 2007.
U.S. Appl. No. 10/465,721, Office Action mailed Aug. 14, 2007.
U.S. Appl. No. 10/465,721, Office Action mailed May 31, 2007.
U.S. Appl. No. 10/465,721, Office Action mailed Dec. 7, 2006.
U.S. Appl. No. 10/465,721, Office Action mailed Aug. 17, 2006.
U.S. Appl. No. 10/465,721, Office Action mailed Jun. 15, 2006.
U.S. Appl. No. 10/465,721, Office Action mailed Jan. 10, 2006.
U.S. Appl. No. 10/465,721, Office Action mailed May 5, 2005.
U.S. Appl. No. 10/465,721, Office Action mailed Nov. 22, 2004.
U.S. Appl. No. 10/465,721, Office Action mailed Jul. 9, 2004.
U.S. Appl. No. 10/465,721, Office Action mailed May 4, 2004.
U.S. Appl. No. 10/465,721, Office Action mailed Dec. 11, 2003.
U.S. Appl. No. 10/465,721, “Sequential UV induced chemical vapor deposition”, Fair et al., filed Jun. 18, 2003.
U.S. Appl. No. 11/520,455, Office Action mailed May 14, 2009.
U.S. Appl. No. 11/540,937, Office Action mailed Jul. 22, 2009.
U.S. Appl. No. 11/520,455, Office Action mailed Oct. 16, 2009.
U.S. Appl. No. 11/520,455, Office Action mailed Mar. 2, 2010.
U.S. Appl. No. 11/520,455, Notice of Allowance mailed Sep. 14, 2010.
U.S. Appl. No. 10/465,721, Notice of Allowance mailed Oct. 25, 2010.
Allowed Claims for U.S. Appl. No. 10/465,721 as of Oct. 25, 2010.
U.S. Appl. No. 10/600,622, Notice of Allowance mailed Oct. 28, 2003.
Greer Frank
Leeser Karl
Bryant Kiesha
Novellus Systems Inc.
Perkins Pamela E
Weaver Austin Villeneuve & Sampson LLP
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