Method of producing ferroelectric capacitor

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S003000

Reexamination Certificate

active

07078288

ABSTRACT:
A method of producing a ferroelectric capacitor includes forming a first insulating layer on a semiconductor substrate with an MOSFET. After a first interlayer insulating layer is formed, a first conductive layer, a ferroelectric layer, and a second conductive layer are laminated on the first interlayer insulating layer to form a ferroelectric capacitor. After a first opening is formed in a ferroelectric thin layer, first restoration annealing is performed relative to a first member formed of a first interlayer insulating layer and the ferroelectric capacitor. A second interlayer insulating layer is formed on the first interlayer insulating layer, and a second opening is formed in the second interlayer insulating layer through etching. Then, second restoration annealing is performed relative to a second member formed of the first member and the second interlayer insulating layer with the second opening under in an order of nitrogen, oxygen, and nitrogen, respectively.

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patent: 6022774 (2000-02-01), Kawai et al.
patent: 6100201 (2000-08-01), Maejima et al.
patent: 2003/0203511 (2003-10-01), Ashikaga
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patent: 08-008409 (1996-01-01), None
patent: 10-247724 (1998-09-01), None
patent: 2003-324186 (2003-11-01), None

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